The JEOL JEM-2100Plus Transmission Electron Microscope / Scanning Transmission Electron Microscope.
Configured with the high-resolution pole-piece and applicable to a wide range of applications. Offering a lattice image resolution of 0.14 nm and a point to point resolution of 0.23 nm, in STEM BF mode the edge to edge resolution is up to 1.0 nm. The system is equipped with a LaB6 filament and offers accelerating voltages of 80-200 kV.
- For CTEM the microscope was equipped with the UK’s first Gatan Rio16 4k*4k CMOS camera.
- For STEM the microscope is equipped with BF, ADF (including HAADF) and BEI detectors.
- An EDS detector (JEOL JED-SDD 30 mm2 window) is provided for elemental analysis in CTEM and mapping in STEM modes.
Software is available for tomography in addition to a high tilt holder and a Be analytical double tilt holder for EDS work.