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    • Who We are
    • Partners
    • Leadership Team
  • Services
    • Cleanroom Rentals
    • Cell Therapy Development
    • SARS-CoV-2 Sequencing
    • Investigative MRI
    • Product Design and Registration
    • Nanofabrication and Microfluidics
    • Microbiology Services
    • Smart Medical Textiles
    • High Throughput Screening
      • Biocompatibility
      • Drug Discovery
  • Our Facilities
    • MTIF Research Centre
    • MTIF Development Centre
    • Facilitated Laboratory Rental
  • Our Science
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  • MTIF
  • Transmission Electron Microscopy

JEOL JEM-2100Plus

The JEOL JEM-2100Plus Transmission Electron Microscope / Scanning Transmission Electron Microscope.

Configured with the high-resolution pole-piece and applicable to a wide range of applications. Offering a lattice image resolution of 0.14 nm and a point to point resolution of 0.23 nm, in STEM BF mode the edge to edge resolution is up to 1.0 nm. The system is equipped with a LaB6 filament and offers accelerating voltages of 80-200 kV.

  • For CTEM the microscope was equipped with the UK’s first Gatan Rio16 4k*4k CMOS camera.
  • For STEM the microscope is equipped with BF, ADF (including HAADF) and BEI detectors.
  • An EDS detector (JEOL JED-SDD 30 mm2 window) is provided for elemental analysis in CTEM and mapping in STEM modes.

Software is available for tomography in addition to a high tilt holder and a Be analytical double tilt holder for EDS work.

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