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  • About Us
    • Our Team
    • Strategic Partners
    • Commercial Partners
  • Services
    • Cleanroom Rentals
    • STERIS OR HexaVue™ Integrated Theatre Suite
    • Cell Therapy Development
    • SARS-CoV-2 Sequencing
    • Investigative MRI
    • Product Design and Registration
    • Nanofabrication and Microfluidics
    • Microbiology Services
    • Smart Medical Textiles
    • Imaging Suite
    • Facilitated Laboratory Rental
    • High Throughput Screening
      • Biocompatibility
      • Drug Discovery
  • Our Facilities
    • MTIF Innovation Centre
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  • MTIF
  • Scanning Electron Microscopy

JEOL JSM-7100F LV FEG-SEM

The JSM-7100F LV FEG-SEM offers a guaranteed resolution for SEI of 1.2 nm (30 kV), 3.0 nm (1 kV), and 3.0 nm (15 kV, probe current 5 nA) with a magnification range of 10 to 1,000,000. The system offers accelerating voltages from 0.2-30 kV with a maximum probe current of 200 nA.

The system is equipped with 5 axis motor-controlled specimen stage X, Y: 70 – 50 mm, Z: 3 – 41 mm, Tilt: -5 to +70 degrees, Rotation: 360 degrees. Sample access is provided with a rapid pump airlock.

The system is equipped for BEI and low vacuum mode in addition to SEI. An Oxford Instruments X-Maxn EDS with 80 mm2 window is also equipped along with the accompanying AZtec analysis software.

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